Impact of electrostatic forces in contact-mode scanning force microscopy
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چکیده
منابع مشابه
Application of Scanning Electron and Atomic Force Mode Microscopy on inscription from Proto-Elamite period in Tappeh Sofalin
The study of cultural heritage artifacts and the research of a protection and restoration intervention create with - and are often limited to - a complete characterization of their surface. This is not only factual for museum objects, but also for archaeological artifacts, because the object as it was discovered may contain precious unknown information that could be lost by too much aggressive ...
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ژورنال
عنوان ژورنال: Physical Review B
سال: 2010
ISSN: 1098-0121,1550-235X
DOI: 10.1103/physrevb.81.094109